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CBED Tools for semi-automatic measurement of crystal thicknesses
Shi Honglong1; Luo Minting2; Wang Wenzhong1

Convergent-beam electron diffraction (CBED) is one of the most popular techniques to measure crystal thickness. The traditional measurement involves linear fitting of several fringes across the CBED disc, but for a thin crystal with fewer than three fringes the usefulness of this method will be limited. CBED Tools, a free plugin for the DigitalMicrograph software, provides a fast (similar to 12 min) and accurate algorithm to measure the crystal thickness on the basis of the linear fitting method, but it is also capable of determining the crystal thickness when it is very thin and only one fringe or part of the first fringe is recorded. CBED Tools can also be utilized to handle the severely distorted CBED pattern obtained when the zero-order Laue zone Kikuchi lines overlap with the fringes.

KeywordConvergent-beam Electron Diffraction Thickness Measurement Kossel-mollenstedt Fringes Electron Diffraction Computer Programs
WOS HeadingsScience & Technology ; Physical Sciences
Indexed BySCI
WOS KeywordElectron-diffraction ; Pattern ; Films
WOS Research AreaChemistry ; Crystallography
WOS SubjectChemistry, Multidisciplinary ; Crystallography
Funding Organization985 project(98507010009) ; '211 project' of the Ministry of Education of China ; National Natural Science Foundation of China(11604394) ; Beijing Higher Education Young Elite Teacher Project(YETP1297) ; Undergraduate Research and Innovative Undertaking Programme of Beijing(BEIJ2016110008 ; BEIJ2015110022)
WOS IDWOS:000394289400031
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Document Type期刊论文
Affiliation1.Minzu Univ, Sch Sci, 27 Zhong Guancun South Ave, Beijing 100081, Peoples R China
2.Chinese Acad Sci, Inst Proc Engn, Natl Engn Lab Hydromet Cleaner Prod Technol, Beijing, Peoples R China
Recommended Citation
GB/T 7714
Shi Honglong,Luo Minting,Wang Wenzhong. CBED Tools for semi-automatic measurement of crystal thicknesses[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2017,50:313-319.
APA Shi Honglong,Luo Minting,&Wang Wenzhong.(2017).CBED Tools for semi-automatic measurement of crystal thicknesses.JOURNAL OF APPLIED CRYSTALLOGRAPHY,50,313-319.
MLA Shi Honglong,et al."CBED Tools for semi-automatic measurement of crystal thicknesses".JOURNAL OF APPLIED CRYSTALLOGRAPHY 50(2017):313-319.
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