CBED Tools for semi-automatic measurement of crystal thicknesses
Shi Honglong1; Luo Minting2; Wang Wenzhong1
2017-02-01
发表期刊JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN1600-5767
卷号50页码:313-319
摘要Convergent-beam electron diffraction (CBED) is one of the most popular techniques to measure crystal thickness. The traditional measurement involves linear fitting of several fringes across the CBED disc, but for a thin crystal with fewer than three fringes the usefulness of this method will be limited. CBED Tools, a free plugin for the DigitalMicrograph software, provides a fast (similar to 12 min) and accurate algorithm to measure the crystal thickness on the basis of the linear fitting method, but it is also capable of determining the crystal thickness when it is very thin and only one fringe or part of the first fringe is recorded. CBED Tools can also be utilized to handle the severely distorted CBED pattern obtained when the zero-order Laue zone Kikuchi lines overlap with the fringes.
关键词Convergent-beam Electron Diffraction Thickness Measurement Kossel-mollenstedt Fringes Electron Diffraction Computer Programs
文章类型Article
WOS标题词Science & Technology ; Physical Sciences
DOI10.1107/S1600576716019476
收录类别SCI
语种英语
关键词[WOS]ELECTRON-DIFFRACTION ; PATTERN ; FILMS
WOS研究方向Chemistry ; Crystallography
WOS类目Chemistry, Multidisciplinary ; Crystallography
项目资助者985 project(98507010009) ; '211 project' of the Ministry of Education of China ; National Natural Science Foundation of China(11604394) ; Beijing Higher Education Young Elite Teacher Project(YETP1297) ; Undergraduate Research and Innovative Undertaking Programme of Beijing(BEIJ2016110008 ; BEIJ2015110022)
WOS记录号WOS:000394289400031
引用统计
文献类型期刊论文
条目标识符http://ir.ipe.ac.cn/handle/122111/21947
专题湿法冶金清洁生产技术国家工程实验室
作者单位1.Minzu Univ, Sch Sci, 27 Zhong Guancun South Ave, Beijing 100081, Peoples R China
2.Chinese Acad Sci, Inst Proc Engn, Natl Engn Lab Hydromet Cleaner Prod Technol, Beijing, Peoples R China
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Shi Honglong,Luo Minting,Wang Wenzhong. CBED Tools for semi-automatic measurement of crystal thicknesses[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2017,50:313-319.
APA Shi Honglong,Luo Minting,&Wang Wenzhong.(2017).CBED Tools for semi-automatic measurement of crystal thicknesses.JOURNAL OF APPLIED CRYSTALLOGRAPHY,50,313-319.
MLA Shi Honglong,et al."CBED Tools for semi-automatic measurement of crystal thicknesses".JOURNAL OF APPLIED CRYSTALLOGRAPHY 50(2017):313-319.
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