李玉平; 张懿; 齐涛; 刘克玲
Source Publication光谱学与光谱分析
AbstractThe trace elements Si, Al, Fe, Ca, Mn, Mg, and Cl in the K2Cr2O7 produced by chromate cleaner production were determined by a sequential inductively coupled plasma spectrometer in this paper. Matrix effect was studied and eliminated through matrix matching. The analytical conditions for the elements were optimized. Incident power of the RF generator was 0.95 W. Pressure of carrier gas flow was 0.13 MPa, and its flow rate was 1.2 L(.)min(-1). Auxiliary gas flow rate was 0.2 L(.)min(-1). The element Cl was indirectly determined by the method of AgCl precipitation. The ion Cl- can be completely precipitated in 6% nitric acid system, and then determined after keeping the solution at 50 degreesC for two hours. The recoveries of the studied impurities range from 95% to 104%, and the relative standard deviations are lower than 4% ( n = 10). Detection limits of these impurities are in a range 0.0001%-0.00001% (w/w). The analytical results of random samples agree well with the results using the standard-adding method, and the relative error varies from -4.27% to + 5.26%. The developed method has been applied to the determination of impurities in K2Cr2O7 product with satisfactory results.
Document Type期刊论文
First Author Affilication中国科学院过程工程研究所
Recommended Citation
GB/T 7714
李玉平,张懿,齐涛,等. 用扫描式电感耦合等离子体光谱仪测定红矾钾产品中的杂质[J]. 光谱学与光谱分析,2004,24(11):1428.
APA 李玉平,张懿,齐涛,&刘克玲.(2004).用扫描式电感耦合等离子体光谱仪测定红矾钾产品中的杂质.光谱学与光谱分析,24(11),1428.
MLA 李玉平,et al."用扫描式电感耦合等离子体光谱仪测定红矾钾产品中的杂质".光谱学与光谱分析 24.11(2004):1428.
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