Ultralow Thermal Resistance across the Solid-Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer

doi:10.1021/acs.iecr.9b04480

CAS OpenIR

	Ultralow Thermal Resistance across the Solid-Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer
	Qian, Cheng 1,2; Ding, Bin 3; Wu, Zhiwei 1; Ding, Weilu 1; Huo, Feng 1; He, Hongyan 1; Wei, Ning 2; Wang, Yanlei 1; Zhang, Xiangping 1
	2019-10-30
Source Publication	INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH
ISSN	0888-5885
Volume	58 Issue:43 Pages:20109-20115
Abstract	The understanding and regulation of thermal transport across the solid-liquid interface, especially the electrical double layer (EDL) formed by ionic liquid (IL), is significant for the reasonable design of the efficient thermal dissipation capabilities in the field of chemical engineering. In the present work, by large-scale molecular dynamics simulation method, we reveal that rather than the strong solid-liquid interaction, the atomic structure of EDL dominates the entire interfacial thermal transport across the solid-IL interfaces. The simulation results show that as the surface charge increases, the interfacial thermal resistance (ITR) will decrease in two stages, first sharply and then slowly. The two-dimensional structure factors, the geometry state of cation, and the solid-liquid interfacial energy for different surface charges demonstrate that the evaluation of EDL agrees well with the trend of ITR Furthermore, the vibrational spectrum and frequency-dependent heat flow also indicate that the high-ordered EDL will enhance the interfacial thermal transport in all frequencies, that is, the high-ordered EDL structure can induce the ultralow thermal resistance and enhance the heat dissipation process. These results also enlightened the future rational design and thermal management of the new IL-based nanoelectrical devices as well as coolants used in the advanced chemical engineering processes, such as supercapacitors, Li-ion batteries, and so forth.
DOI	10.1021/acs.iecr.9b04480
Language	英语
WOS Keyword	KAPITZA RESISTANCE ; MOLECULAR-DYNAMICS ; HEAT-TRANSPORT ; WATER ; GRAPHENE ; WETTABILITY ; NANOFLUIDS ; CONDUCTION ; FLOW
Funding Project	National Key Research and Development Program of China[2018YFB0605802] ; National Natural Science Foundation of China[21890762] ; National Natural Science Foundation of China[21808220] ; National Natural Science Foundation of China[11502217] ; National Natural Science Foundation of China[21776278] ; Fund of State Key Laboratory of Multiphase Complex Systems[MPCS-2019-A-08] ; Beijing Natural Science Foundation[2192052] ; Beijing Natural Science Foundation[2184124] ; Fundamental Research Funds for the Central Universities[2452015054]
WOS Research Area	Engineering
WOS Subject	Engineering, Chemical
Funding Organization	National Key Research and Development Program of China ; National Natural Science Foundation of China ; Fund of State Key Laboratory of Multiphase Complex Systems ; Beijing Natural Science Foundation ; Fundamental Research Funds for the Central Universities
WOS ID	WOS:000493867400038
Publisher	AMER CHEMICAL SOC
Citation statistics	Cited Times:8[WOS] [WOS Record] [Related Records in WOS]
Document Type	期刊论文
Identifier	http://ir.ipe.ac.cn/handle/122111/38897
Collection	中国科学院过程工程研究所
Corresponding Author	Wei, Ning; Wang, Yanlei
Affiliation	1.Chinese Acad Sci, Inst Proc Engn, Beijing Key Lab Ion Liquids Clean Proc, CAS Key Lab Green Proc & Engn,State Key Lab Multi, Beijing 100190, Peoples R China 2.Northwest A&F Univ, Key Lab Agr Soil & Water Engn Arid & Semiarid Are, Minist Educ, Yangling 712100, Shaanxi, Peoples R China 3.Brown Univ, Sch Engn, Providence, RI 02912 USA
Recommended Citation GB/T 7714	Qian, Cheng,Ding, Bin,Wu, Zhiwei,et al. Ultralow Thermal Resistance across the Solid-Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer[J]. INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH,2019,58(43):20109-20115.
APA	Qian, Cheng.,Ding, Bin.,Wu, Zhiwei.,Ding, Weilu.,Huo, Feng.,...&Zhang, Xiangping.(2019).Ultralow Thermal Resistance across the Solid-Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer.INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH,58(43),20109-20115.
MLA	Qian, Cheng,et al."Ultralow Thermal Resistance across the Solid-Ionic Liquid Interface Caused by the Charge-Induced Ordered Ionic Layer".INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH 58.43(2019):20109-20115.

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