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Y_2O_3稳定ZrO_2材料的电导活化能
李英; 谢裕生; 陈运法; 龚江宏; 唐子龙; 张中太
2002
Source Publication无机材料学报
Issue04Pages:811-816
Abstract在313~473K温度范围内测定了一种Y2O3稳定ZrO2材料(YSZ)的交流电导率谱,进而导出了材料的直流电导率并分析了其随温度的变化关系.研究发现:在低温下材料的电导活化能随温度的升高而增大.这一实验现象与在高温下所观察到的活化能随温度升高而降低的规律截然相反.通过分析材料中氧空位的解缔及迁移机制,对YSZ材料中电导活化能随温度的变化关系作出了一个合理的解释.
Keyword离子电导率 电导活化能 缺陷缔合 Zro2基固体电解质
Indexed ByCSCD
CSCD IDCSCD:954149
Citation statistics
Cited Times:9[CSCD]   [CSCD Record]
Document Type期刊论文
Identifierhttp://ir.ipe.ac.cn/handle/122111/9002
Collection研究所(批量导入)
Recommended Citation
GB/T 7714
李英,谢裕生,陈运法,等. Y_2O_3稳定ZrO_2材料的电导活化能[J]. 无机材料学报,2002(04):811-816.
APA 李英,谢裕生,陈运法,龚江宏,唐子龙,&张中太.(2002).Y_2O_3稳定ZrO_2材料的电导活化能.无机材料学报(04),811-816.
MLA 李英,et al."Y_2O_3稳定ZrO_2材料的电导活化能".无机材料学报 .04(2002):811-816.
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