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CBED Tools for semi-automatic measurement of crystal thicknesses 期刊论文
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2017, 卷号: 50, 页码: 313-319
Authors:  Shi Honglong;  Luo Minting;  Wang Wenzhong
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Convergent-beam Electron Diffraction  Thickness Measurement  Kossel-mollenstedt Fringes  Electron Diffraction  Computer Programs