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CBED Tools for semi-automatic measurement of crystal thicknesses 期刊论文
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2017, 卷号: 50, 页码: 313-319
Authors:  Shi Honglong;  Luo Minting;  Wang Wenzhong
Adobe PDF(1249Kb)  |  Favorite  |  View/Download:83/0  |  Submit date:2017/04/07
Convergent-beam Electron Diffraction  Thickness Measurement  Kossel-mollenstedt Fringes  Electron Diffraction  Computer Programs  
已知晶体电子衍射指标化中的实际问题 期刊论文
电子显微学报, 2015, 期号: 1, 页码: 25-32
Authors:  施洪龙;  雒敏婷;  王文忠
Adobe PDF(619Kb)  |  Favorite  |  View/Download:137/0  |  Submit date:2015/05/13
电子衍射  指标化  衍射分析  
A method for structure analysis of nanomaterials by electron diffraction: Phase identification and unit cell determination 期刊论文
MICROSCOPY RESEARCH AND TECHNIQUE, 2013, 卷号: 76, 期号: 6, 页码: 641-647
Authors:  Shi Honglong;  Zhang Guling;  Zou Bin;  Luo Minting;  Wang Wenzhong
Adobe PDF(521Kb)  |  Favorite  |  View/Download:63/0  |  Submit date:2015/05/05
Saed  Phase Identification  Unit Cell Determination  Structure Analysis  Nanomaterials  
MICROSCOPY RESEARCH AND TECHNIQUE 期刊论文
MICROSCOPY RESEARCH AND TECHNIQUE, 2013, 卷号: 76, 期号: 6, 页码: 641-647
Authors:  Shi Honglong;  Zhang Guling;  Zou Bin;  Luo Minting;  Wang Wenzhong;  Shi, HL
Adobe PDF(521Kb)  |  Favorite  |  View/Download:186/5  |  Submit date:2013/09/27
Saed  Phase Identification  Unit Cell Determination  Structure Analysis  Nanomaterials